From 27 October to 2 November 2019, Xnext took part in Manchester, UK, in the IEEE Nuclear Science Symposium (NSS) and Medical Imaging Conference (MIC), and the International Symposium on Room Temperature Semiconductor Detectors (RTSD).
This joint conference is the leading annual international meeting for all scientists, engineers, researchers, medical physicists and students with an interest in radiation detectors, related technologies and their applications. Exciting developments and new directions are emerging in many areas of our field.
From a scientific perspective
The event provided an exceptional opportunity for Xnext to share along with its main scientific partners, Polytechnic University of Milan (PoliMI) and IMEM – The National Research Council (CNR), its most recent research results.
During one speaker session, Xnext had the opportunity to present its patented innovation, XSpectra®, and explain scientifically why it makes the difference in the X-ray inspection technology. Its unique performance makes it an absolute must-have solution for mulltiple industries, ranging from quality control to material recycling, passing through security controls, and much more.
The presentation gave particular emphasis on the application of Xspectra® in the field of real-time detection of contaminants in food products on production lines. While describing the technology architecture, it outlined the raison d’être of the Horizon 2020 XSpectra project.
From a commercial perspective
Other than scientific dissemination, the international conference gave Xnext the possibility to showcase its product, XSpectra®, and thus gain visibility, while networking with an international group of major scientists, engineers and suppliers of radiation instrumentation.
To know more about:
the 2019 NSS-MIC-RTSD Conference, click here
Xnext intervention and associated work:
- XSpectra®: an Advanced Real-Time Food Contaminants Detector (click here for a summary – oral presentation session)
- Response and spectroscopic performance of a CdTe pixel detector at deep sub-microsecond signal processing time (click here for a summary – oral presentation session)
- Spectral Response Simulator of Semiconductor-based X- and Gamma-ray Detectors (click here for a summary – poster session)
- High Order Peak Pileup Correction Algorithm (click here for a summary – poster session)
